Abstract:
PbS thin films were deposited on glass and stainless steel substrates using PACBD method. The as-deposited and annealed films were characterized for structural, morphological, compositional, optical and electrochemical properties. Cyclic voltammetry indicated a reversible redox reaction with electrochemical interfacial capacitance of 101mF/cm2 and 75mF/cm2 for as-deposited and 200oC-annealed films repectively at 20mV/s scan rate. Phase angle of impedance was less negative than that of a perfect capacitor (-90), indicating frequency dispersion. Constant phase element was used to fit interfacial capacitance in the corresponding equivalent circuit. Incoporation of PVP into PbS matrix enhanced its electrochemical properties compared to typical PbS film
